Arbitrary Waveform Generator
AWG7000 Series (AWG7102 • AWG7101 • AWG7052 •
AWG7051)
The AWG7000 Series of Arbitrary Waveform Generators
Delivers the Industry’s Best Mixed Signal Stimulus Solution
for Ever-increasing Measurement Challenges
The AWG7000 Series Arbitrary Waveform Generator delivers a
unique combination of superior signal stimulus, unrivaled
sample rate, bandwidth and signal fidelity and uncompromised
usability.
This family offers the industry’s best solution to the
challenging signal stimulus issues faced by designers
verifying, characterizing and debugging sophisticated
electronic designs.
With sample rates from 5 GS/s to 20 GS/s
(10-Bits), together with 1 to 2 output channels, the toughest
measurement challenges in the disk drive, communications,
digital consumer and semiconductor design/test industries can
be easily solved.
The open Windows (Windows XP)-based instruments deliver
ease of use and allow connectivity with peripherals and
compatibility with third-party software.
Application Examples
The need for performance arbitrary waveform generation is
broad and spans over a wide array of applications. With the
AWG7000 Series, Tektronix’ 3rd generation of
industry leading Arbitrary Waveform Generators represent a new
benchmark in performance, sample rate, signal fidelity, and
timing resolution.
The ability to create, generate, or replicate either ideal,
distorted, or “real-life” signals is essential in the design
and testing process. Signal generation with controllable rise-
and fall times, noise or jitter; pre-emphasis, multilevel and
mixed signals; wideband RF, and fast changing signals are just
some of the capabilities of the AWG7000 Series.
Pre/De-Emphasized Signal Generation
With increasing transmission speeds and to compensate for
frequency characteristics of “lossy” media, the technique
of pre/de-emphasis is increasingly applied. Serial data
standards such as PCI Express and others have also included
pre/de-emphasis tests as a requirement to meet the respective
compliance test specification.
The basic theory of pre-emphasis is that for any series of
bits of the same value, the first bit always has a higher
voltage level than the following bits. By doing so, frequency
characteristics of transmission lines can be compensated thus
the signal fidelity at the receiver side increased.
The AWG7000 Series, with its performance and analog output,
enables users to directly generate pre/de-emphasized signals
for next generation serial data standards. It also enables
users to generate 3-level signals as required for SATA
Out-of-Band (OOB) testing.
The direct generation of such signals provides an increased
signal quality and avoids cumbersome signal generation via
multiple channels and power combiner. See Figure 1.
Figure 1: 5 Gb/s Pre/De-emphasized
signal.
Multilevel Signal Generation
The requirements for serial interfaces are continuously
increasing. Higher and higher data rates are required, and the
performance of cables and circuits is moving closer to their
theoretical limits. One technique to increase the data rate
without increasing the transition-rate is by applying
multilevel signals, wherein a signal can assume more than the
standard binary 2 levels.
In multi-level signaling one can think of multi-level
discrete amplitudes of a signal. This phenomenon is known as
pulse-amplitude-modulation or PAM. A 4PAM signal, a signal
with 4 different amplitudes, increases the data rate by four
without increasing the transition rate of the signal.
Multilevel signals are not only applied for data transmission.
Multi-level memory chips, storing more than a single bit in an
individual memory element, are being produced and multi-level
coding of data for storage on optical disks is being
considered as an efficient way to increase storage
capacity.
The AWG7000 Series enables you to test your latest design
by generating any kind of mixed or multi-level signal. See
Figure 2.
Figure 2: 20 Gb/s 4PAM signal
(5 GS/s; AWG7101)
Signal Generation for Storage Device Testing
Increasing capacity requirements for storage devices leads
to the development of new and faster read- and-write
strategies for magnetic as well as optical storage devices.
Multi-level coding of data for storage on optical disks is
also being considered as an efficient way to increase storage
capacity.
The AWG7000 Series with its ability to generate an
accurate reproduction of the readandwrite signals,
enables users to design, develop and test the latest storage
devices. With sample rates up to 20 GS/s, and the
generation of up to 6 signals (2 analog plus
4 Marker) with a clock timing resolution of 100 ps,
the AWG7000 Series represents a new benchmark in the
industry. See Figure 3.
Figure 3: Hard disk read channel signal
(5 Gb/s 2 points per cell); AWG7101 with
10 GS/s
Wideband RF-Signal Generation
In the RF world, technologies ranging from a wireless mouse
to a satellite image require test equipment that can provide
enough sample rate and resolution to re-create even the most
complex RF behavior. The latest digital RF technologies
often exceed the capabilities of current test equipment to
generate wide bandwidth and fast changing signals that are
increasingly seen in many wireless applications such as radar,
UWB, and others.
The AWG7000 Series enables the direct generation of RF
signals and their output via the D/A converter for signals up
to a carrier frequency of 5 GHZ and a Bandwidth of
5.8 GHZ. The direct generation of IF or RF signals
avoids I/Q degradations and lengthy adjustments
associated with traditional generation using I/Q modulators.
The AWG7000 Series with its maximum sample rate of
20 GS/s is the sole solution that allows a direct RF
signal generation for up to 5 GHZ. See Figure 4.
Figure 4: UWB (MBOA) three band (480 Mb/s
1795 MAC bytes 96 symbol payload);
3.168 GHZ-4.752 GHZ; AWG7102; Interleave
at 15.84 GS/s; 0.5 Vp-p
